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  首页 > 产品中心 > 进口微波探针 > 微波测试探针 Model 40A Dual
       
  Model 40A Dual
  型  号: Model 40A Dual(美国GGB)
  产  地: 美国、原装进口
  测试对象: 用于探测集成电路、微器件等
  探针类型: 差分测试探针
  频率范围: DC 至 40 GHz
  接头类型: 2.92mm K 连接器(兼容3.5mm)
  建议搭配: 适用MP-150R、MP-200R 探针座等
       
详细介绍:    
The PICOPROBE® DUAL MICROWAVE PROBE consists of two separate probes mounted on a single holder. One probe is fixed to the holder; the other is adjustable. Each probe may be individually configured with GSG, GS, or SG footprints having any fixed pitch from 50 to 2540 microns. The probe to probe (signal to signal) spacing is user adjustable over a 4000 micron (160 mil) range. When ordering, an initial signal to signal spacing should be specified (up to .75 inches).
Features:  
Two probes on one positioner
Ground to signal spacing from 50 to 2540 microns
Signal to signal spacing is user adjustable
Same performance as individual Model 40A, 50A, 67A, and 110H probes
Patented coaxial design
Differential calibration substrates available for two, three and four port calibrations